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Fast Breaking Comments

By John Robertson

ESI Special Topics, August 2006
Citing URL - http://www.esi-topics.com/fbp/2006/august06-JohnRobertson.html

John Robertson answers a few questions about this month's fast breaking paper in the field of Physics. 


From •>>August 2006

Field: Physics
Article Title: High dielectric constant oxides
Authors: Robertson, J
Journal: EUR PHYS J-APPL PHYS
Volume: 28
Issue: 3
Page: 265-291
Year: DEC 2004
* Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England.
* Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England.

ST:  Why do you think your paper is highly cited?


The review article deals with how we are improving the electrical properties and materials science of these oxides so that they can be used.”

The paper deals with high-k oxides for Si transistors. This is a critical new issue for the semiconductor industry. There is one major review for this subject, published when the field was quite new—"High-kappa gate dielectrics: Current status and materials properties considerations" by G. D. Wilk, R. M. Wallace, and J.M. Anthony, Journal of Applied Physics 89 (10): 5243-5275, May15, 2001—which has received over 1,000 citations. This is still the most cited paper in the area, but it is now getting a bit old, and the objective of my paper is to present a more recent review.

ST:  Could you summarize the significance of your paper in layman's terms?

The semiconductor industry is a huge, worldwide industry. The complementary metal oxide Si (CMOS) transistor has generally improved its performance by a factor of 1.5 to 2 each year. However, it is now reaching performance limits which are partly to do with introducing new materials.

A key component of the transistor is the "gate oxide" which is presently silicon dioxide-based, but it needs to be replaced by another oxide of higher dielectric constant (high-k), to keep power dissipation within limits.

The high-k oxides initially had rather poor electrical properties, and very little was known about them. But they were urgently needed within a five-to-six-year time frame. The review article deals with how we are improving the electrical properties and materials science of these oxides so that they can be used.

ST:  How did you become involved in this research, and were any problems encountered along the way?

I do much of the theory of electronic structure which underpins our understanding and development of these materials. As the theory should be closely related to experiment, this forces me to have a good working knowledge of both the experimental situation, as well as the theoretical part.End

ISIHighlyCited.com View John Robertson's record in ISIHighlyCited.com.

John Robertson, Ph.D.
Professor of Electronics
University of Cambridge
Engineering Department
Cambridge, UK

ESI Special Topics, August 2006
Citing URL - http://www.esi-topics.com/fbp/2006/august06-JohnRobertson.html

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